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Aehr Test SystemsのEV/EBIT

Aehr Test SystemsのEV/EBITは何ですか。

Aehr Test SystemsのEV/EBITはN/Aです。

EV/EBITの定義は何ですか。



Enterprise value to earnings before interest and taxes (EV/EBIT) is a financial ratio used to measure if a stock is priced appropriately to similar stocks and the market. It is similar to the P/E ratio.

ttm (trailing twelve months)

The EV/EBIT ratio addresses some of the shortcomings of the P/E ratio. Instead of taking market capitalization, the ratio uses enterprise value, as it takes into account the true value of the company. Enterprise value includes both equity and debt. It is calculated as:

Enterprise value = market cap + total debt – cash and cash equivalents

The EV/EBIT ratio is useful in comparing peers within the wider market. A high EV/EBIT ratio indicates that a company’s stock is overvalued. On the opposite, a low EV/EBIT ratio indicates that a company’s stock is undervalued. The lower the ratio, the more financially stable a company should be. However, investors and analyst should use other ratios and information to get a full picture of a company’s financial state and actual value.

NASDAQのセクタTechnologyにおけるEV/EBITの企業と比べるAehr Test Systems

Aehr Test Systemsは何をしますか。

headquartered in fremont, california, aehr test systems is a worldwide supplier of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. aehr test has developed and introduced several innovative products, including the abts, foxtm and max systems and the diepak® carrier. the abts system is aehr test’s newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. the fox system is a full wafer contact test and burn-in system. the max system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. the diepak carrier is a reusable, temporary package that enables ic manufacturers to perform cost-effective final test and burn-in of bare die.

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